Šveicarija – Elektroniniai mikroskopai – FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Šveicarija – Elektroniniai mikroskopai – FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
I dalis: Perkančioji organizacija
I.1) Pavadinimas ir adresai:
Oficialus
pavadinimas: Empa zentraler Einkauf
Adresas: Überlandstrasse 129
Miestas: Dübendorf
Pašto
kodas: 8600
Šalis: Šveicarija
Asmuo
ryšiams:
El-paštas: wto@empa.ch
Interneto adresas (-ai):
II dalis: Objektas
II.1.1) Pavadinimas:
FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
II.1.2) Pagrindinis BVPŽ kodas:
38511000
Elektroniniai mikroskopai
II.1.3) Sutarties tipas:
Kita
II.1.4) Trumpas aprašymas:
The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
II.2) Aprašymas:
II.2.1) Kitas (-i) šio pirkimo BVPŽ kodas (-ai):
38511000 Elektroniniai mikroskopai