Airija – Laboratorinė, optinė ir precizinė įranga (išskyrus akinius) – LA3208C - DCU - RFT for the Supply, Delivery, Installation, and Commissioning of an X-ray/Hard X-ray Photoelectron Spectrometer Platform with Imaging and Advanced Characterisation Capabilities

Airija – Laboratorinė, optinė ir precizinė įranga (išskyrus akinius) – LA3208C - DCU - RFT for the Supply, Delivery, Installation, and Commissioning of an X-ray/Hard X-ray Photoelectron Spectrometer Platform with Imaging and Advanced Characterisation Capabilities

I dalis: Perkančioji organizacija

I.1) Pavadinimas ir adresai:

Oficialus pavadinimas: Education Procurement Service (EPS)
Adresas: Castletroy Limerick
Miestas: Limerick
Pašto kodas: V94 DK53
Šalis: Airija
Asmuo ryšiams:
El-paštas: info@educationprocurementservice.ie
Interneto adresas (-ai):
Pagrindinis adresas: https://www.educationprocurementservice.ie/

II dalis: Objektas

II.1.1) Pavadinimas:

LA3208C - DCU - RFT for the Supply, Delivery, Installation, and Commissioning of an X-ray/Hard X-ray Photoelectron Spectrometer Platform with Imaging and Advanced Characterisation Capabilities

II.1.2) Pagrindinis BVPŽ kodas:

38000000 Laboratorinė, optinė ir precizinė įranga (išskyrus akinius)

II.1.3) Sutarties tipas:

Kita

II.1.4) Trumpas aprašymas:

Dublin City University seeks to expand its research capacity in terms of X-ray photoelectron spectroscopy XPS by establishing an Advanced Material Characterisation and Imaging Platform which combines several key characterisation methods into a single, user-friendly instrument. The system will be able to provide XPS spectroscopy at higher photon energy than commonly used in laboratories, the system must be able to operate in imaging mode creating elemental maps and be able to provide additional measurement modes including: Scanning electron microscopy SEM for sample inspection/area selection, Scanning Auger microscopy SAM for complementary elemental analysis, UV photoelectron spectroscopy UPS for higher resolution valence band measurements, Inverse photoemission IPES for conduction band measurements, A method of sample sputtering to create depth profiles of all measurements. The system must be user friendly with automated sample handling and switch of measurement geometry, as well as being able to handle samples with high vapour pressure by allowing operation up to pressures of at least 1e-7 mbar, or higher. The system will be a platform/base chamber for material characterisation, and we are specifically looking for a system which can be further upgraded in the future.

II.2) Aprašymas:

II.2.1) Kitas (-i) šio pirkimo BVPŽ kodas (-ai):

38000000 Laboratorinė, optinė ir precizinė įranga (išskyrus akinius)